The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2011
Filed:
Sep. 20, 2007
Xiaoming Du, Shanghai, CN;
Kevin George Harding, Niskayuna, NY (US);
Steven Robert Hayashi, Niskayuna, NY (US);
Jianming Zheng, Shanghai, CN;
Tian Chen, Shanghai, CN;
Howard Paul Weaver, Mason, OH (US);
Yong Yang, Atlanta, GA (US);
Guofei HU, Shanghai, CN;
James Allen Baird, Jr., Amelia, OH (US);
Xiaoming Du, Shanghai, CN;
Kevin George Harding, Niskayuna, NY (US);
Steven Robert Hayashi, Niskayuna, NY (US);
Jianming Zheng, Shanghai, CN;
Tian Chen, Shanghai, CN;
Howard Paul Weaver, Mason, OH (US);
Yong Yang, Atlanta, GA (US);
Guofei Hu, Shanghai, CN;
James Allen Baird, Jr., Amelia, OH (US);
General Electric Company, Niskayuna, NY (US);
Abstract
A method of calibrating an inspection system is provided. The method includes contacting a test part with a run-out measurement device and rotating the test part and measuring a first run-out using the run-out measurement device. The method also includes moving the run-out measurement device to a new position and repeating the steps of contacting and rotating the test part to measure a second run-out at the new position. The method further includes using the first and second run-outs to adjust measurements of the inspection system.