The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2011
Filed:
Jun. 11, 2003
Martin Schmidt, Schwartau, DE;
Jochen Koetke, Hamburg, DE;
Peter Schalt, Moorrege, DE;
Stefan Oelckers, Berlin, DE;
Rolf-rainer Grigat, Halstenbek, DE;
Lars Eckert, Munich, DE;
Thomas Hoell, Halle, DE;
Martin Schmidt, Schwartau, DE;
Jochen Koetke, Hamburg, DE;
Peter Schalt, Moorrege, DE;
Stefan Oelckers, Berlin, DE;
Rolf-Rainer Grigat, Halstenbek, DE;
Lars Eckert, Munich, DE;
Thomas Hoell, Halle, DE;
Moeller-Wedel GmbH, Wedel, DE;
Abstract
The invention relates to a method for positional optimization in navigation, in particular neural navigation in surgery with an operation microscope and at least one optoelectronic image detector which may be connected to the microscope and also a computer system. The data obtained from the at least one image detector which lie in the microscope field-of-view for the operator, contain information on the position of an operation instrument, in particular the instrument tip. The actual position of the instrument in the x- and y-direction as well as in the z-direction of a three-dimensional coordinate system is continuously or intermittently determined from the relevant positional data. A separation determination is carried out for the positional determination in the z-direction by means of depth of focus evaluation and/or stereoscopic image analysis. The invention further relates to a navigation instrument, using marking, close to the instrument tip, lying within the field of view of the microscope during use thereof.