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The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7912329 B1

PDFFull Text
Expired
Date of Patent:
Mar. 22, 2011

Filed:

Aug. 18, 2009

Optical-switch testing apparatus, optical-signal switching apparatus, optical-switch testing method, and control method for optical-signal switching

Applicants:

Yoshio Sakai, Kawasaki, JP;

Yuji Tochio, Kawasaki, JP;

Kazuyuki Mori, Kawasaki, JP;

Atsuo Ishizuka, Kawasaki, JP;

Inventors:

Yoshio Sakai, Kawasaki, JP;

Yuji Tochio, Kawasaki, JP;

Kazuyuki Mori, Kawasaki, JP;

Atsuo Ishizuka, Kawasaki, JP;

Assignee:

Fujitsu Limited, Kawasaki, JP;

Attorney:

Staas & Halsey LLP

Primary Examiner:

Mark A Robinson

Assistant Examiner:

Jerry Blevins

Int. Cl.
CPC ...
G02B 6/26 (2006.01); G02B 6/42 (2006.01); G01R 31/08 (2006.01); H04Q 11/00 (2006.01); H04B 10/08 (2006.01); H04J 14/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A light source supplies optical signal to an optical switch and a detector detects light receiving level. A control unit changes a deflection control amount for changing an angle of a tilt mirror, and outputs the deflection control amount to a driving unit. When an input and an output ports are same, optical offset of the tilt mirror is calculated based on optimal angle at which the light detector detects an optimal point of the light receiving level. Whenever the input and the output port are different, a structure parameter of the tilt mirror is calculated based on the optical offset and the optimal angle. The optical offset and the structure parameter are stored in a memory as a test result.

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Sakai, Yoshio. (2011). Optical-switch testing apparatus, optical-signal switching apparatus, optical-switch testing method, and control method for optical-signal switching (U.S. Patent No. 7912329). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7912329

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