The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2011
Filed:
Oct. 10, 2007
Jen-chien Hsu, Taichung, TW;
Hung-wen LU, Taoyuan County, TW;
Chau-chin Su, Taipei, TW;
Yeong-jar Chang, Hsinchu County, TW;
Jen-Chien Hsu, Taichung, TW;
Hung-Wen Lu, Taoyuan County, TW;
Chau-Chin Su, Taipei, TW;
Yeong-Jar Chang, Hsinchu County, TW;
Faraday Technology Corp., Science-Based Industrial Park, Hsin-Chu, TW;
Abstract
A jitter measurement circuit and a method for calibrating the jitter measurement circuit are disclosed. The jitter measurement circuit includes a synchronous dual-phase detector and a decision circuit. In a test mode, a probability distribution function (PDF) of the jitter of a clock signal output by a circuit under test is obtained. In a calibration mode, a random clock, which is externally generated or generated by a free-run oscillator in the circuit under test, is used to calibrate the synchronous dual-phase detector. The decision circuit performs logic operations, data latching and counting on a phase relationship detected by the synchronous dual-phase detector in order to obtain a counting value and a PDF relative to the jitter of the clock signal.