The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2011

Filed:

Mar. 15, 2010
Applicants:

Takehisa Sasabayashi, Echizen, JP;

Tomoyuki Nakamura, Moriyama, JP;

Masayuki Ishihara, Yasu, JP;

Takayuki Yao, Higashiomi, JP;

Inventors:

Takehisa Sasabayashi, Echizen, JP;

Tomoyuki Nakamura, Moriyama, JP;

Masayuki Ishihara, Yasu, JP;

Takayuki Yao, Higashiomi, JP;

Assignee:

Murata Manufacturing Co., Ltd., Nagaokakyo-shi, Kyoto-fu, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01G 4/06 (2006.01); C04B 35/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A dielectric ceramic contains a BaTiO-based compound as a main ingredient, and can be represented by the general formula: 100ABO+aNiO+bRO+cMO+dMgO+eXOwhere R represents a rare earth element such as Dy, M represents a metal element such as Mn, and X represents a sintering aid component containing Si. Ni is uniformly solid-solved in crystal grains, and the solid-solution region of the rare earth element in the crystal grains is an average 10% or less in terms of a cross section ratio. 0.96≦m≦1.030, 0.05≦a≦3, 0.1≦b≦1.5, 0.1≦c≦1.0, 0.1≦d≦1.5, and 0.05≦e≦3.5 are satisfied. A laminated ceramic capacitor has dielectric layers formed of the dielectric ceramic. As a result, a dielectric ceramic, and a laminated ceramic capacitor having excellent AC voltage characteristics, capable of keeping desired dielectric characteristics and excellent temperature characteristics, and having excellent withstand voltage and capable of ensuring reliability can be realized.


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