The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2011
Filed:
Feb. 07, 2008
Hidekazu Shimomura, Yokohama, JP;
Hidekazu Shimomura, Yokohama, JP;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
An optical scanning device includes a condensing optical system for collecting a light beam emitted from light source means, a deflecting system for scanningly deflecting the light beam collected by the condensing optical system, and an imaging optical system configured to image the light beam scanningly deflected by the deflecting means, on a surface to be scanned, the deflecting means having a deflecting surface reciprocally movable within a main-scan sectional plane to scanningly deflect the light beam from the condensing optical system, wherein, when the deflecting surface reciprocally moves within the main-scan sectional plane, the deflecting surface receives an angular acceleration which is able to cause deformation being asymmetric with respect to a sub-scan direction, and wherein the condensing optical system collects the light beam from the light source means to a region of the deflecting surface which is at a side of a central line of the deflecting surface with respect to the sub-scan direction where an amount of asymmetric deformation of the deflecting surface in the sub-scan direction is smaller than that at the other side.