The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2011
Filed:
May. 16, 2008
Volodymyr Redko, Coral Springs, FL (US);
Elena M. Shembel, Coral Springs, FL (US);
Yurii V. Sokhach, Dnepropetrovsk, UA;
Olexandr Kudrevatykh, Dnepropetrovsk, UA;
Volodymyr Redko, Coral Springs, FL (US);
Elena M. Shembel, Coral Springs, FL (US);
Yurii V. Sokhach, Dnepropetrovsk, UA;
Olexandr Kudrevatykh, Dnepropetrovsk, UA;
Enerize Corporation, Coral Springs, FL (US);
Abstract
The present invention is connected with the holographic interferometry method and device that provides, to a very high precision, the reconstructing the original waveform of light emitted or reflected by an object. This method allows image resolution close to that of the wavelength of the light being used. The non-destructive method of holographic interferometry coupled with impulse heating of the test article to allow observation of its dynamic response to operating conditions, as described herein, is one of the most effective non-contact automated quality control methods available.