The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2011

Filed:

Dec. 20, 2006
Applicants:

Hiroshi Horiuchi, Otawara, JP;

Hiroshi Aida, Otawara, JP;

Inventors:

Hiroshi Horiuchi, Otawara, JP;

Hiroshi Aida, Otawara, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T 1/20 (2006.01);
U.S. Cl.
CPC ...
Abstract

A first protective layer is formed on the surface of a photoelectric conversion substrate on which photoelectric transducers have been provided, and then, a scintillator layer is formed thereon, whereby degradation of the photoelectric transducers due to the contact with the scintillator layer is prevented. A second protective layer covering the surface of the scintillator is formed. A peripheral part of the first protective layer is allowed to be in close contact with a peripheral part of the second protective layer to seal the scintillator layer between the first protective layer and the second protective layer, whereby degradation of the scintillator layer due to the moisture in the atmospheric air is prevented.


Find Patent Forward Citations

Horiuchi, Hiroshi. (2011). Method for manufacturing x-ray detector and x-ray detector (U.S. Patent No. 7910892). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7910892

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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