The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2011
Filed:
Jul. 21, 2009
Andrew Bowdler, Staffordshire, GB;
Andrew Bowdler, Staffordshire, GB;
Kratos Analytical Limited, Manchester, GB;
Abstract
The present invention provides a mass spectrometer including an ion source for generating pre-cursor ions, ion fragmentation means for generating fragment ions from the pre-cursor ions, a reflectron for focusing the kinetic energy distribution of the ions, and an ion detector wherein the mass spectrometer also includes axial spatial distribution focusing means which in use acts on the ions after the ion fragmentation means and before the reflectron, the axial spatial distribution focusing means being operable to reduce the spatial distribution of the ions in the direction of the ion optical axis of the spectrometer. Suitably the axial spatial distribution focusing means comprising a cell with two electrodeswhich may be apertures or high transmission grids. A pulsed electrostatic field is generated by applying a high voltage pulseto the first electrodeat the time when the pre-cursor ions of interesthave just passed into the pulser. The second electrodeis maintained at 0V during this time.