The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7910291 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 22, 2011

Filed:

Dec. 29, 2006
Applicants:

Cheol Kyu Bok, Seoul, KR;

Hyun Sook Jun, Gyeonggi-do, KR;

Tae Seung Eom, Gyeonggi-do, KR;

Inventors:

Cheol Kyu Bok, Seoul, KR;

Hyun Sook Jun, Gyeonggi-do, KR;

Tae Seung Eom, Gyeonggi-do, KR;

Assignee:

Hynix Semiconductor Inc., Icheon-si, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for manufacturing a semiconductor device using an immersion lithography process is disclosed. The immersion lithography process includes forming a photoresist film over an underlying layer of a semiconductor substrate; exposing the photoresist film to light without using an exposure mask; and performing an exposure process using an exposure mask. After exposure using the immersion lithography, a water mark generated from the exposure layer consumes a part of the acid of the exposure layer but the residual acid remains in the exposure layer to prevent generation of pattern defects such as T-top or pattern bridges.


Find Patent Forward Citations

Bok, Cheol. (2011). Method for manufacturing semiconductor device using immersion lithography process (U.S. Patent No. 7910291). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7910291

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