The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2011

Filed:

Apr. 06, 2006
Applicants:

James M. Hamilton, Sunnyvale, CA (US);

Robert S. Dubrow, San Carlos, CA (US);

Calvin Y. H. Chow, Portola Valley, CA (US);

Inventors:

James M. Hamilton, Sunnyvale, CA (US);

Robert S. Dubrow, San Carlos, CA (US);

Calvin Y. H. Chow, Portola Valley, CA (US);

Assignee:

Nanosys, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 27/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

This invention provides nanowire based molecular sensors and methods for detecting analytes in a microfluidic system. Methods for sensing analytes include detecting changed electrical parameters associated with contact of a nanowire with the analyte in a microfluidic system. Sensors of the invention include nanowires mounted in microchambers of a microfluidic system in electrical contact with the detector, whereby electrical parameter changes induced in the nanowire by the analyte can be monitored by the detector.


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