The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2011

Filed:

Jan. 06, 2009
Applicants:

Boian Todorov Alexandrov, Upper Arlington, OH (US);

John C. Lippold, Hilliard, OH (US);

Seth Jason Norton, Katy, TX (US);

Inventors:

Boian Todorov Alexandrov, Upper Arlington, OH (US);

John C. Lippold, Hilliard, OH (US);

Seth Jason Norton, Katy, TX (US);

Assignee:

The Ohio State University, Columbus, OH (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 25/02 (2006.01); G01K 3/08 (2006.01);
U.S. Cl.
CPC ...
Abstract

A device and method for investigating phase transformation properties and structural changes of materials. In one form, the device simulates actual thermal processing conditions, while the method can be used in both simulations as well as in actual processing conditions. An analysis using at least one of the device and method is referred to as a single sensor differential thermal analysis, as it compares the temperature recorded in a measured specimen against a reference thermal history without requiring the derivation of the reference thermal history from measured reference temperatures.


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