The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 22, 2011
Filed:
Nov. 29, 2007
Thomas Bosselmann, Marloffstein, DE;
Henrik Stiesdal, Odense C, DK;
Thomas Bosselmann, Marloffstein, DE;
Henrik Stiesdal, Odense C, DK;
Siemens Aktiengesellschaft, Munich, DE;
Abstract
A method of non-destructively testing a work piece is disclosed, wherein the work piece is placed within an active field of a positioning system; a frame of reference of the work piece is established based on the geometry of the work piece in the coordinates of the positioning system; the geometry of the work piece is detected by determining the position of specific transponders, which are fixed to the work piece, by the positioning system or the geometry of the work piece is detected by scanning at least parts of the contour of the work piece with a transponder of the positioning system; testing data is acquired for the work piece with a non-destructive testing probe, which comprises a transponder of the positioning system, while the position of the testing probe is recorded by the positioning system; the position of the testing probe is transformed into an intrinsic position defined with respect to the frame of reference of the work piece; and the intrinsic position of the testing probe is assigned to the testing data recorded at the respective position. Moreover, a non-destructive testing arrangement is provided.