The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 22, 2011

Filed:

Apr. 19, 2006
Applicants:

Ian William Mclean, Edinburgh, GB;

Nicholas John Weston, Peebles, GB;

Martin Simon Rees, Edinburgh, GB;

Leo Christopher Somerville, St. Charles, IL (US);

Inventors:

Ian William McLean, Edinburgh, GB;

Nicholas John Weston, Peebles, GB;

Martin Simon Rees, Edinburgh, GB;

Leo Christopher Somerville, St. Charles, IL (US);

Assignee:

Renishaw PLC, Wotton-under-Edge, GB;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 5/008 (2006.01); G01B 5/20 (2006.01); G01B 7/28 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for measuring a surface profile using a surface sensing device mounted on an articulating probe head in which the probe head is moved along a nominal path relative to the surface profile, an at least approximation of the surface normal of the surface profile, the surface profile is sensed with the surface sensing device and the distance or force of the surface sensing device relative to the surface profile substantially in the direction of the surface normal. The surface normal may be determined by approximating at least one section to a curved profile which can be mathematically parameterised.


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