The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2011
Filed:
Sep. 28, 2007
Martin George Gach, Mentor on the Lake, OH (US);
Timothy Siorek, Newbury, OH (US);
Jonathan D. Bradford, Harpersfield, OH (US);
Robert J. Kretschmann, Bay Village, OH (US);
Kendal R. Harris, Mentor, OH (US);
Kenwood H. Hall, Hudson, OH (US);
Charles Martin Rischar, Chardon, OH (US);
Mark Joseph Balewski, Independence, OH (US);
Martin George Gach, Mentor on the Lake, OH (US);
Timothy Siorek, Newbury, OH (US);
Jonathan D. Bradford, Harpersfield, OH (US);
Robert J. Kretschmann, Bay Village, OH (US);
Kendal R. Harris, Mentor, OH (US);
Kenwood H. Hall, Hudson, OH (US);
Charles Martin Rischar, Chardon, OH (US);
Mark Joseph Balewski, Independence, OH (US);
Rockwell Automation Technologies, Inc., Mayfield Heights, OH (US);
Abstract
Systems and methods that correlate among disparate pieces of synchronized data, collected from an 'internal' data stream (e.g., history data collected from an industrial unit) and an 'external' data stream (e.g., traffic data on network services). A process trend component that determines/predicts an outcome of an industrial process and facilitates diagnostics/prognostics of an industrial system. Accordingly, relations among various parameters can be discovered (e.g., dynamically) and proper corrective adjustments supplied to the industrial process. Such enables a tight control and short reaction time to process parameters, and for a modification thereof.