The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2011

Filed:

Dec. 12, 2005
Applicants:

Roy Lurie, Hopkinton, MA (US);

Thomas Gaudette, Jamaica Plain, MA (US);

Inventors:

Roy Lurie, Hopkinton, MA (US);

Thomas Gaudette, Jamaica Plain, MA (US);

Assignee:

The MathWorks, Inc., Natick, MA (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/16 (2006.01);
U.S. Cl.
CPC ...
Abstract

An instrument-based distributed computing system is disclosed that accelerates the measurement, analysis, verification and validation of data in a distributed computing environment. A large computing work can be performed in a distributed fashion using the instrument-based distributed system. The instrument-based distributed system may include a client that creates a job. The job may include one or more tasks. The client may distribute a portion of the job to one or more remote workers on a network. The client may reside in an instrument. One or more workers may also reside in instruments. The workers execute the received portion of the job and may return execution results to the client. As such, the present invention allows the use of instrument-based distributed system on a network to conduct the job and facilitate decreasing the time for executing the job.


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