The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2011

Filed:

Jun. 09, 2009
Applicants:

Adam Yeh, Bellevue, WA (US);

Jonathan Tang, Bellevue, WA (US);

Alvin Lo, Bellevue, WA (US);

Inventors:

Adam Yeh, Bellevue, WA (US);

Jonathan Tang, Bellevue, WA (US);

Alvin Lo, Bellevue, WA (US);

Assignee:

Microsoft Corporation, Redmond, WA (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/10 (2006.01); G06F 7/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention provides an architecture for obtaining an analytical view of data. The invention includes a model service component for receiving an indication of a first object model and generating a dimensional model and a second object model from the first object model. The second object model is analytical in that it preserves relationships identified in the dimensional model, but allows the user to obtain information in terms of objects instead of specifying the data in terms of the dimensional model. The architecture also includes a navigational component that allows a user to navigate from the second object model to underlying data represented by the first object model.


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