The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2011
Filed:
Apr. 14, 2008
Paul B. Liu, Cupertino, CA (US);
Fu-kuo Chang, Stanford, CA (US);
Shawn J. Beard, Livermore, CA (US);
Irene LI, Stanford, CA (US);
Paul B. Liu, Cupertino, CA (US);
Fu-Kuo Chang, Stanford, CA (US);
Shawn J. Beard, Livermore, CA (US);
Irene Li, Stanford, CA (US);
Acellent Technologies, Inc., Sunnyvale, CA (US);
Abstract
A method useful in structural health monitoring (SHM) systems for detecting damages in metal structures includes extracting the zero-order symmetric and anti-symmetric mode signal components from each of a plurality of current sensor signals of an array of transducers mounted on the structure, matching the extracted signal components with corresponding signal components of a plurality of baseline sensor signals previously detected in the structure, computing respective indices Iand Ifor each of the matched extracted current and baseline signal components based on respective signal energies thereof, and determining the presence of a damage in the structure if either of the indices Iand Iof a plurality of neighboring sensor paths of the structure is greater than a selected threshold value.