The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2011
Filed:
Jan. 26, 2009
Hans-peter Loock, Kingston, CA;
Zhaoguo Tong, Kitchener, CA;
Hans-Peter Loock, Kingston, CA;
Zhaoguo Tong, Kitchener, CA;
Queen's University at Kingston, Kingston, Ontario, CA;
Abstract
The invention provides a method and apparatus for measuring one or more optical properties, such as absorbance and refractive index, of a test medium such as a gas, a liquid, or solid material. The method comprises providing a passive optical waveguide loop comprising the test medium, launching in the optical loop an intensity-modulated light at a reference phase, detecting a phase of said light along the optical waveguide loop, and comparing the detected phase of said light along the loop with the reference phase, wherein the comparison provides information about one or more optical properties of the test medium.