The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2011
Filed:
Jul. 02, 2007
Stephen James Hardy, West Pymble, AU;
Peter Alleine Fletcher, Rozelle, AU;
Stephen James Hardy, West Pymble, AU;
Peter Alleine Fletcher, Rozelle, AU;
Canon Kabushiki Kaisha, Tokyo, JP;
Abstract
A system () and a method () are described for determining a two-dimensional position of a location in an image. The method () starts by imaging () a two-dimensional pattern (). The two-dimensional pattern comprises a plurality of at least partially overlapping two-dimensional sub-patterns (). The sub-patterns () repeat with different spatial periods to form the two-dimensional pattern, and the spatial period of the sub-patterns are anharmonic. A two-dimensional offset for each of the sub-patterns is then determined () at the location in the image formed by the imaging. The two-dimensional position is determined from said two-dimensional offsets.