The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2011
Filed:
Jun. 04, 2007
Mitsuhiro Bekku, Tokyo, JP;
Naotaka Adachi, Tokyo, JP;
Mitsuhiro Bekku, Tokyo, JP;
Naotaka Adachi, Tokyo, JP;
GE Medical Systems Global Technology Company, LLC, Waukesha, WI (US);
Abstract
The invention is intended to obtain optimal shim values even if slice planes are slanted with respect to the system-inherent coordinate system. The section for setting a plane for calculating shim values sets planes perpendicular to and a plane parallel with a slice plane in a system of coordinates x', y′, and z′ perpendicular to the slice plane. The section for calculating shim values obtains shim values with regard to this slice plane in this coordinate system, based on data acquired by the data acquiring section. The coordinates converting section converts the thus obtained shim values to shim values in the system-inherent x-y-z coordinate system of the MRI apparatus.