The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 15, 2011
Filed:
Jan. 29, 2008
Lazar Fleysher, Brooklyn, NY (US);
Roman Fleysher, Stamford, CT (US);
Oded Gonen, Leonardo, NJ (US);
Lazar Fleysher, Brooklyn, NY (US);
Roman Fleysher, Stamford, CT (US);
Oded Gonen, Leonardo, NJ (US);
New York University, New York, NY (US);
Abstract
An exemplary embodiment of system, computer-accessible medium and method for determining exemplary values for acquisition parameters for a given time (e.g., imaging time) is provided, e.g., with the exemplary values being selectable to increase the signal-to-noise ratio. According to certain exemplary embodiments of the present disclosure, data (e.g., image data) associated with at least one portion of a target can be generated. For example, a first signal from the target resulting from at least one first excitation pulse forwarded toward the target can be acquired using a plurality of acquisition parameters having first values. Further, a second signal from the target resulting from at least one second excitation pulse forwarded toward the target can be acquired using a plurality of acquisition parameters having second values, with the second values being different from the first values. The data (e.g., image data) may be generated based on the first and second signals.