The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2011

Filed:

Jun. 22, 2005
Applicant:

Woon Suh Paik, Gyeonggi-do, KR;

Inventor:

Woon Suh Paik, Gyeonggi-do, KR;

Assignee:

Neopoly Inc., Seoul, KR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/84 (2006.01); H01L 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of crystallizing an amorphous semiconductor thin film formed on a substrate is provided. The method includes the steps of: forming a gate insulation film and a gate electrode on an amorphous semiconductor thin film; locally forming first and second crystallization induced metal patterns for inducing crystallization of the amorphous semiconductor thin film, on part of the amorphous semiconductor thin film spaced at a predetermined off-set distance from the gate insulation film; ion-injecting impurities into the substrate to thus define a source/drain region; forming a protection film on the whole surface of the substrate; and heat-treating the substrate in the air to thereby crystallize the amorphous semiconductor thin film. As a result, the protection film such as an oxide film is coated in advance before a metal induced lateral crystallization (MILC) heat treatment when the amorphous semiconductor thin film is crystallized, to thereby enabling the MILC heat treatment even in the air as well as under the inert gas, hydrogen, or vacuum atmosphere, and to thus save a cost for maintaining a heat treatment atmosphere.


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