The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 15, 2011

Filed:

Jul. 01, 2009
Applicant:

Richard Macmanus, Narragansett, RI (US);

Inventor:

Richard MacManus, Narragansett, RI (US);

Assignee:

Hexagon Metrology, Inc., North Kingstown, RI (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for determining probe tip diameters with improved accuracy and reliability that includes performing a routine for determining probe tip diameter multiple times with the arm of the coordinate measurement machine in different machine positions. Diameter values associated with each of the calibration routines may be combined in a manner that provides more accurate diameter measurements.


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