The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2011
Filed:
Sep. 09, 2008
Applicant:
Thomas R. Toms, Dripping Springs, TX (US);
Inventor:
Thomas R. Toms, Dripping Springs, TX (US);
Assignee:
QUALCOMM Incorporated, San Diego, CA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G01R 31/02 (2006.01); H01L 23/58 (2006.01); H01L 23/12 (2006.01); H01L 23/34 (2006.01); H01L 23/48 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of testing a die having a non-testable circuit, where the non-testable circuit is logically incomplete and forms part of a logically complete multiple tier circuit. The method includes reconfiguring a tier-to-tier input point or tier-to-tier output point associated with a primary path of the non-testable circuit to create a logically complete secondary path for the tier-to-tier point such that the non-testable circuit can be tested. Testable dies and methods of preparing such dies are also provided.