The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2011

Filed:

Jan. 20, 2010
Applicants:

Wei Fan, New York, NY (US);

Haixun Wang, Tarrytown, NY (US);

Philip S. Yu, Chappaqua, NY (US);

Inventors:

Wei Fan, New York, NY (US);

Haixun Wang, Tarrytown, NY (US);

Philip S. Yu, Chappaqua, NY (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/18 (2006.01); G06N 3/00 (2006.01); G06N 3/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method (and structure) for processing an inductive learning model for a dataset of examples, includes dividing the dataset of examples into a plurality of subsets of data and generating, using a processor on a computer, a learning model using examples of a first subset of data of the plurality of subsets of data. The learning model being generated for the first subset comprises an initial stage of an evolving aggregate learning model (ensemble model) for an entirety of the dataset, the ensemble model thereby providing an evolving estimated learning model for the entirety of the dataset if all the subsets were to be processed. The generating of the learning model using data from a subset includes calculating a value for at least one parameter that provides an objective indication of an adequacy of a current stage of the ensemble model.


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