The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7904116 B1

PDF
Full Text
Expired
Date of Patent:
Mar. 08, 2011

Filed:

Feb. 14, 2006
Applicants:

Yasuhiro Tanaka, Aichi, JP;

Seigo Nakao, Gifu, JP;

Inventors:

Yasuhiro Tanaka, Aichi, JP;

Seigo Nakao, Gifu, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04M 1/00 (2006.01); H04B 1/38 (2006.01);
U.S. Cl.
CPC ...
Abstract

An examining unit examines the radio wave environments on at least one of a plurality of frequency channels usable in communications. Based on a result of examination by the examining unit, a selector selects a frequency channel to be used for communications. While using the channel selected by the selector, an execution unit transmits signals from a plurality of antennas to a terminal apparatus and performs calibration on the plurality of antennas by receiving signals from the terminal apparatus via the plurality of antennas.


Find Patent Forward Citations

Tanaka, Yasuhiro. (2011). Calibration method, and base station apparatus, terminal apparatus and radio apparatus utilizing the same (U.S. Patent No. 7904116). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7904116

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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