The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2011
Filed:
Dec. 16, 2008
Melissa Ann Monahan, Rochester, NY (US);
William Alexander Burton, Fairport, NY (US);
Paul M. Fromm, Rochester, NY (US);
Stephen Bradley Williams, Marion, NY (US);
Julie Marie Hanfland, Pittsford, NY (US);
Melissa Ann Monahan, Rochester, NY (US);
William Alexander Burton, Fairport, NY (US);
Paul M. Fromm, Rochester, NY (US);
Stephen Bradley Williams, Marion, NY (US);
Julie Marie Hanfland, Pittsford, NY (US);
Xerox Corporation, Norwalk, CT (US);
Abstract
A method and apparatus for measuring nip width in an image production device is disclosed. The method may include receiving a signal to measure the nip width, the nip width being the distance of an arc length created by an intersection of a fuser roll and a pressure roll, positioning a nip width measuring device into the nip, measuring the nip width, determining if the measured nip width meets a required nip width, wherein if the measured nip width does not meet the required nip width, adjusting the nip width.