The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2011
Filed:
Dec. 01, 2006
Hiroaki Komatsu, Nagano, JP;
Fuminori Takahashi, Nagano, JP;
Takanori Miki, Kanagawa, JP;
Masami Haino, Tokyo, JP;
Hiroaki Komatsu, Nagano, JP;
Fuminori Takahashi, Nagano, JP;
Takanori Miki, Kanagawa, JP;
Masami Haino, Tokyo, JP;
Eastman Kodak Company, Rochester, NY (US);
Abstract
Apparatus includes a change operator for detecting change factor information which causes the deterioration in the image; an iterative processing operator which iterates a processing cycle comprising; a first processing step to apply a first calculation to a first image utilizing the change factor information to generate a second image, calculating difference data between the deteriorated image and the second image; a second processing step to apply a second calculation to the second image utilizing the difference data to generate a third image; and a replacing step to replace the first image with the third image; wherein the processing cycle further includes (a) detecting whether a coincidence exists between the sign of a first difference data and the sign of a second difference data or not, and (b) increasing an absolute value of the difference data utilized in the second processing step when the coincidence is detected in step (a).