The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2011

Filed:

Oct. 28, 2008
Applicants:

Joan Laverne Mitchell, Longmont, CO (US);

Timothy James Trenary, Fort Collins, CO (US);

Nenad Rijavec, Longmont, CO (US);

Ian Richard Finlay, Ontario, CA;

Inventors:

Joan LaVerne Mitchell, Longmont, CO (US);

Timothy James Trenary, Fort Collins, CO (US);

Nenad Rijavec, Longmont, CO (US);

Ian Richard Finlay, Ontario, CA;

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/32 (2006.01); G06K 9/36 (2006.01);
U.S. Cl.
CPC ...
Abstract

The scaling down of data is provided. At least two blocks of transformed data samples representing at least two blocks of original data samples are received. One of at least two tables of constants is selected wherein each table of constants is capable of reducing the number of transformed data samples by a different factor. The constants taken from the selected table are applied to the at least two blocks of transformed data samples to produce one block of transformed data samples representing one block of final data samples. The data is processed one dimension at a time by multiplying the data in one dimension with selected constants taken from previously developed tables corresponding to the desired scale down factor. Scaling down by different factors in each dimension as well as scaling down in one dimension and scaling up in the other dimension may be achieved.


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