The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2011
Filed:
Jan. 17, 2007
Arnaud Lina, Montreal, CA;
Louis-antoine Blais-morin, Montreal, CA;
Yves Rioux, Montréal, CA;
Matrox Electronic Systems, Ltd., Dorval, Quebec, CA;
Abstract
A method for the detection of an irregularity in an object based on an image of the object that includes the steps of binarizing the image at a plurality of binarization thresholds to obtain a plurality of binarized images, extracting information from each of the binarized images, estimating the regular object resulting from the binarization at the respective binarization threshold of an image of a version of the object in which the irregularity is absent, combining the information extracted from each of the binarized images, and detecting the irregularity based on the combined information. A method for the detection of a defect in a solder element based on an X-ray image of the solder element. This aspect includes the steps of binarizing the image at a plurality of binarization thresholds to obtain a plurality of binarized images, extracting information from each of the binarized images, combining the information extracted from each of the binarized images, and detecting the defect based on the combined information.