The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2011

Filed:

Jul. 08, 2005
Applicants:

Achim Kirsch, Hamburg, DE;

Fritz Jetzek, Hamburg, DE;

Inventors:

Achim Kirsch, Hamburg, DE;

Fritz Jetzek, Hamburg, DE;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06K 9/00 (2006.01); G06K 9/48 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for detecting geometrical structures in images, especially in images of chemical and/or biological samples, such as images of cells, the method comprising the following steps: detecting a boundary line of the image object; defining at least one sector inside the image, the origin (p) of which lies on the boundary line; transforming the image section defined by the sector into a transformation space by means of a transformation that associates signatures in the transformation space with respective geometrical structures in the image section; determining the presence of at least one signature inside the transformation space; and retransforming the signatures from the transformation space into the sector for the representation of the geometrical structure.


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