The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2011

Filed:

Dec. 01, 2008
Applicant:

Motokazu Yamana, Tokyo, JP;

Inventor:

Motokazu Yamana, Tokyo, JP;

Assignee:

Olympus Corporation, Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A movable part to which a specimen or optical component is fixed is effectively damped in a short period of time at low cost, while saving space and energy and avoiding heat generation, thus allowing high-precision observation of a specimen to be carried out quickly after stopping at a certain position. The invention provides a microscope system including a driving mechanism for driving a movable part to which a specimen or optical component is fixed and stopping the movable part at a certain position; and a vibration damping mechanism for damping vibrations generated when stopping the movable part with the driving mechanism. The vibration damping mechanism includes an inertial member having a prescribed mass and a viscoelastic member sandwiched between the inertial member and the movable part. Dimensions in a plurality of directions of the viscoelastic member are set on the basis of resonance frequencies of vibrations generated in multiple directions when stopping the movable part.


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