The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2011
Filed:
Nov. 03, 2008
Johannes Wagner, Taching/Tengling, DE;
Sebastian Gries, Bergen, DE;
Johannes Wagner, Taching/Tengling, DE;
Sebastian Gries, Bergen, DE;
Dr. Johannes Heidenhain GmbH, Traunreut, DE;
Abstract
A position measuring arrangement including a scale connected with a first object, wherein the scale includes a reference marking and a plurality of graduated areas, which are arranged a periodically in the measuring direction and have different optical properties. Respective additional structures are arranged in the measuring direction adjacent to the reference marking, which extend in the measuring direction and minimize secondary maxima in the reference pulse signal, wherein the additional structures includes at least two tracks having a first optical property, between which a graduated area having a second optical property and extending in the measuring direction is arranged. The position measuring arrangement further includes a scanning unit movable in relation to the scale in the measuring direction and is connected with a second object, the scanning unit includes individual detector elements, whose geometric arrangement is matched to the reference marking for generating the reference pulse signal.