The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 08, 2011

Filed:

Feb. 16, 2010
Applicants:

Jonathan M. Saint Clair, Seattle, WA (US);

Mitchell D. Voth, Sumner, WA (US);

David C. Soreide, Seattle, WA (US);

William D. Sherman, Renton, WA (US);

Inventors:

Jonathan M. Saint Clair, Seattle, WA (US);

Mitchell D. Voth, Sumner, WA (US);

David C. Soreide, Seattle, WA (US);

William D. Sherman, Renton, WA (US);

Assignee:

The Boeing Company, Chicago, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 11/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods to control projection of a pattern are provided. A particular method includes receiving first three-dimensional coordinates that specify one or more locations on a surface of a workpiece where the one or more locations correspond to a part definition to be projected onto the surface. The method also includes computing scan angles for a scanning system based on the first three-dimensional coordinates. The scan angles specify angles used by the scanning system to direct a beam of light to project the part definition onto the surface. The method also includes sending control signals to the scanning system based on the scan angles.


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