The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2011
Filed:
Aug. 19, 2009
Marcus Dyba, Mannheim, DE;
Hilmar Gugel, Dossenheim, DE;
Marcus Dyba, Mannheim, DE;
Hilmar Gugel, Dossenheim, DE;
Leica Microsystems CMS GmbH, Wetzlar, DE;
Abstract
A method and a microscope, in particular a laser scanning fluorescence microscope, for high spatial resolution examination of samples, the sample () to be examined comprising a substance that can be repeatedly converted from a first state (Z, A) into a second state (Z, B), the first and the second states (Z, A; Z, B) differing from one another in at least one optical property, comprising the steps that the substance in a sample region (P) to be recorded is firstly brought into the first state (Z, A), and that the second state (Z, B) is induced by means of an optical signal (), spatially delimited subregions being specifically excluded within the sample region (P) to be recorded, are defined in that the optical signal () is provided in such a way that a standing wave with defined intensity zero points () is formed in the sample region (P) to be recorded.