The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2011
Filed:
Jan. 09, 2009
Larry Eccleston, Everett, WA (US);
Chris W. Lagerberg, Seattle, WA (US);
John Renner, Iii, Arlington, WA (US);
David J. Gibson, Sr., Everett, WA (US);
Larry Eccleston, Everett, WA (US);
Chris W. Lagerberg, Seattle, WA (US);
John Renner, III, Arlington, WA (US);
David J. Gibson, Sr., Everett, WA (US);
Fluke Corporation, Everett, WA (US);
Abstract
A reversible test probe and test probe tip. In one embodiment, a test probe tip is reversible relative to a test probe body. The reversible probe has a first probe tip at a first end and a second probe tip at a second end. The test probe body has an opening operable to receive the first probe tip and the second probe tip. When the first probe tip is positioned in the opening, the first probe tip is electrically coupled to a metal device in the test probe body. When the second probe tip is positioned in the opening, the second probe tip is electrically coupled to a metal device in the test probe body. In another embodiment, a test probe having two test probe tips is reversible relative to a test lead.