The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2011
Filed:
Apr. 06, 2007
Yuk Ming Dennis Lo, Kowloon, HK;
Rossa Wai Kwun Chiu, New Territories, HK;
Stephen Siu Chung Chim, Quarry Bay, HK;
Chunming Ding, New Territories, HK;
Shengnan Jin, New Territories, HK;
Tracy Yuen Han Lee, Tsuen Wan, HK;
Fiona Miu Fun Lun, New Territories, HK;
Yuk Ming Dennis Lo, Kowloon, HK;
Rossa Wai Kwun Chiu, New Territories, HK;
Stephen Siu Chung Chim, Quarry Bay, HK;
Chunming Ding, New Territories, HK;
Shengnan Jin, New Territories, HK;
Tracy Yuen Han Lee, Tsuen Wan, HK;
Fiona Miu Fun Lun, New Territories, HK;
The Chinese University of Hong Kong, Shatin N.T., HK;
Abstract
This application provides the use of novel fetal markers for prenatal diagnosis and monitoring of certain pregnancy-related conditions. More specifically, the invention resides in the discovery that certain CpG islands located on fetal chromosome 21 demonstrate a methylation profile that is distinct from that of the corresponding CpG islands located on maternal chromosome 21. This application also provides kits for diagnosing or monitoring of the relevant conditions.