The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 08, 2011
Filed:
May. 07, 2009
Christoph Hauger, Aalen, DE;
Markus Seesselberg, Aalen, DE;
Dieter Quendt, Essingen, DE;
Carl Zeiss Surgical GmbH, Oberkochen, DE;
Abstract
The invention is directed to an ophthalmologic surgical microscope system () for examining the eye of a patient. The ophthalmologic surgical microscope system includes a surgical microscope () as well as a carrier arrangement () wherein the surgical microscope () is accommodated so as to permit elevation adjustment in order to be able to adjust a work distance between the surgical microscope () and the eye of the patient. An ophthalmoscopic ancillary module () is connected to the surgical microscope and has an adjustable ophthalmoscopic magnifier system in order to adjust a distance between the ophthalmoscopic magnifier and the surgical microscope (). The ophthalmologic surgical microscope system () has a sensor system for measuring the distance of the surgical microscope () from the patient eye. The sensor system is configured as an OCT-measuring device.