The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2011
Filed:
Jun. 12, 2006
Wes D. Hayutin, Raleigh, NC (US);
Howard S. Krovetz, Holly Springs, NC (US);
Joshua D. Ghiloni, Durham, NC (US);
Seth A. Schwartzman, Raleigh, NC (US);
Wes D. Hayutin, Raleigh, NC (US);
Howard S. Krovetz, Holly Springs, NC (US);
Joshua D. Ghiloni, Durham, NC (US);
Seth A. Schwartzman, Raleigh, NC (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method, apparatus and computer-usable medium for the improved automated testing of a software application's graphical user interface (GUI) through implementation of a recording agent that allows the GUI interactions of one or more human software testers to be captured and incorporated into an error-tolerant and adaptive automated GUI test system. A recording agent is implemented to capture the GUI interactions of one or more human software testers. Testers enact a plurality of predetermined test cases or procedures, with known inputs compared against preconditions and expected outputs compared against the resulting postconditions, which are recorded and compiled into an aggregate test procedure. The resulting aggregate test procedure is amended and configured to correct and/or reconcile identified abnormalities to create a final test procedure that is implemented in an automated testing environment. The results of each test run are subsequently incorporated into the automated test procedure, making it more error-tolerant and adaptive as the number of test runs increases.