The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2011

Filed:

Apr. 25, 2005
Applicants:

Shubha Kadambe, Thousand Oaks, CA (US);

Leandro G. Barajas, Rochester Hills, MI (US);

Youngkwan Cho, Los Angeles, CA (US);

Pulak Bandyopadhyay, Rochester Hills, MI (US);

Inventors:

Shubha Kadambe, Thousand Oaks, CA (US);

Leandro G. Barajas, Rochester Hills, MI (US);

Youngkwan Cho, Los Angeles, CA (US);

Pulak Bandyopadhyay, Rochester Hills, MI (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 15/18 (2006.01);
U.S. Cl.
CPC ...
Abstract

Disclosed herein are a system and method for trend prediction of signals in a time series using a Markov model. The method includes receiving a plurality of data series and input parameters, where the input parameters include a time step parameter, preprocessing the plurality of data series according to the input parameters, to form binned and classified data series, and processing the binned and classified data series. The processing includes initializing a Markov model for trend prediction, and training the Markov model for trend prediction of the binned and classified data series to form a trained Markov model. The method further includes deploying the trained Markov model for trend prediction, including outputting trend predictions. The method develops an architecture for the Markov model from the data series and the input parameters, and disposes the Markov model, having the architecture, for trend prediction.


Find Patent Forward Citations

Loading…