The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2011

Filed:

Dec. 01, 2004
Applicants:

Charles D. Rizzolo, Fairport, NY (US);

Ronald E. Stokes, Fairport, NY (US);

Louis F. Lavallee, Webster, NY (US);

Charles M. Gardiner, Fairport, NY (US);

William R. Smith, Webster, NY (US);

Kathy Cupo, Pittsford, NY (US);

Richard S. Pagano, Webster, NY (US);

Joel S. Cornell, Pittsford, NY (US);

Barry P. Mandel, Fairport, NY (US);

Ralph E. Simpson, Rochester, NY (US);

John T. Potter, Pittsford, NY (US);

Inventors:

Charles D. Rizzolo, Fairport, NY (US);

Ronald E. Stokes, Fairport, NY (US);

Louis F. LaVallee, Webster, NY (US);

Charles M. Gardiner, Fairport, NY (US);

William R. Smith, Webster, NY (US);

Kathy Cupo, Pittsford, NY (US);

Richard S. Pagano, Webster, NY (US);

Joel S. Cornell, Pittsford, NY (US);

Barry P. Mandel, Fairport, NY (US);

Ralph E. Simpson, Rochester, NY (US);

John T. Potter, Pittsford, NY (US);

Assignee:

Xerox Corporation, Norwalk, CT (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06Q 10/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A critical parameter/requirements management process model for managing a development program for a product and an associated product structure-driven critical parameter/requirements management tool and environment is provided. In one embodiment, the process includes a product structure classification scheme, a parameter/requirements classification scheme, a parameter/requirements process and maturity model, and in-process and requirements conformance views. In one embodiment, the tool includes a user interface layer, a business layer, a data layer, and a database. The user interface layer may include a product structure feature group, an add/edit/link feature group, a manage maturity feature group, and a manage conformance feature group. The tool may be implemented as a web server accessible to user workstations operating as thin clients. The tool may be integrated with one or more other product development tools, such as a document-driven requirements management, configuration management, manufacturing/production control system, problem management, and phased product delivery process tools.


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