The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2011

Filed:

Nov. 02, 2004
Applicants:

Valery Kanevsky, San Lorenzo, CA (US);

Bruce Hamilton, Menlo Park, CA (US);

Inventors:

Valery Kanevsky, San Lorenzo, CA (US);

Bruce Hamilton, Menlo Park, CA (US);

Assignee:

Agilent Technologies, Inc., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method for deciding the relationship between a physical property and a threshold, comprising measuring a physical property to obtain a measured value, calculating the distribution of actual values for the physical property, calculating the error distribution of the obtained measured value, calculating the penalty associated with an erroneous decision, and calculating a margin based on the expected loss from selecting at least one possible actual value as a function of the calculated distribution of actual values, the calculated error distribution of the measured value, and the calculated penalty associated with an erroneous decision. Embodiments including a system and apparatus are also disclosed.


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