The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2011

Filed:

Jul. 31, 2008
Applicants:

Vyacheslav L. Zavadsky, Ottawa, CA;

Mykola Sherstyuk, Ottawa, CA;

Inventors:

Vyacheslav L. Zavadsky, Ottawa, CA;

Mykola Sherstyuk, Ottawa, CA;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F 11/26 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

There is presented a system and method for characterizing an integrated circuit (IC) for comparison with a pre-defined system-level characteristic related to an aspect of IC operation, wherein a test procedure on the IC that invokes this aspect is executed, while at least one operational bottleneck is invoked to constrain operation of the IC to exhibit a system-level operation thereof related to the aspect. Data generated via the test procedure in response to the bottleneck is collected and the system-level operation exhibited thereby is compared for consistency with the pre-defined system-level characteristic.


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