The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 01, 2011
Filed:
Dec. 12, 2005
Bernardus Leonardus Gerardus Bakker, Eindhoven, NL;
Bernardus Leonardus Gerardus Bakker, Eindhoven, NL;
Koninklijke Philips Electronics N.V., Eindhoven, NL;
Abstract
A method of calibrating an optical analysis system uses multivariate optical signal analysis. The method includes determining a parameter of a reference sample, and comparing the actually determined parameter with a reference parameter that represents a precise and real property of the reference sample. Based on the comparison, a calibration value is determined that is applicable to perform a calibration of the optical analysis system with respect to at least one compound or analyte of the reference sample. Parameters and reference parameters of a reference sample may refer to a concentration of an analyte dissolved in the sample, or to spectroscopic background signals that have to be taken into account when performing a spectral analysis based on optical signals obtained from the reference sample. Analyte-specific reference data is stored in a calibration unit of the optical analysis system and allows a high degree of automation of the calibration process.