The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2011

Filed:

May. 24, 2005
Applicants:

Clement Woon, Heerbrugg, CH;

Peter A. Stegmaier, Uetikon a/S, CH;

Klaus Schneider, Dornbirn, AT;

Martin Nix, Rebstein, CH;

Inventors:

Clement Woon, Heerbrugg, CH;

Peter A. Stegmaier, Uetikon a/S, CH;

Klaus Schneider, Dornbirn, AT;

Martin Nix, Rebstein, CH;

Assignee:

Leica Geosystems AG, Heerbrugg, CH;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention relates to a method for controlling a surface-modifying machine, wherein information on the desired condition and on the actual condition of ground to be prepared is provided and is used to derive control statements for the machine based on a comparison of the desired and the actual condition. The information on the actual condition is represented by a point cloud as a spatial distribution of discrete surface points. In order to derive control statements, at least two surface points each from the point cloud are used for every horizontal position so that non-differentiated information can be derived that for example also allow to identify various planes.


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