The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2011

Filed:

Mar. 26, 2004
Applicants:

Yoshihiro Hashimoto, Tokyo, JP;

Junichiro Ichikawa, Tokyo, JP;

Kaoru Higuma, Tokyo, JP;

Takahisa Fujita, Tokyo, JP;

Inventors:

Yoshihiro Hashimoto, Tokyo, JP;

Junichiro Ichikawa, Tokyo, JP;

Kaoru Higuma, Tokyo, JP;

Takahisa Fujita, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04B 10/04 (2006.01); H04B 10/121 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method and device for adequately controlling the DC bias of each of the optical modulating sections of an optical modulator even while the optical modulator is operating in normal mode and even with a simple structure. An optical modulator bias controller (B) for controlling the DC bias of each optical modulating section of an optical modulator () is characterized by comprising DC bias application means () for applying a DC bias to each of the optical modulating sections, a low-frequency signal superimposing circuit () for superimposing a low-frequency signal fwith a specific frequency on a modulating signal b applied to each optical modulating section, optical sensing means () for sensing a change of the intensity of the light wave passing through the combining section, and bias control means () for extracting the change of the intensity of light corresponding to the low-frequency signal from the optical sensing means and controlling the DC bias application means according to the extracted change of the intensity of light.


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