The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2011

Filed:

Jan. 19, 2007
Applicants:

Feng YE, Alameda, CA (US);

Ho-shang Lee, El Sobrante, CA (US);

Robert Schleicher, Danville, CA (US);

Inventors:

Feng Ye, Alameda, CA (US);

Ho-Shang Lee, El Sobrante, CA (US);

Robert Schleicher, Danville, CA (US);

Assignee:

Dicon Fiberoptics, Inc., Richmond, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04J 14/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

At least one diffraction element is used to diffract light of multiple wavelengths into different wavelength components. Instead of moving the diffraction element as in certain prior filters, light from the at least one element is reflected back towards the at least one element so that light is diffracted at least twice by the at least one element. The reflection is such that at least one selected wavelength component of said wavelength components will pass from an input port to an output port or to another device.


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