The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2011

Filed:

Oct. 13, 2006
Applicants:

Trevor Anderson, Northcote, AU;

Sarah Dods, Box Hill North, AU;

Adam Kowalczyk, Glen Waverly, AU;

Justin Bedo, Australian Capital Territory, AU;

Kenneth Paul Clarke, Glen Iris, AU;

Inventors:

Trevor Anderson, Northcote, AU;

Sarah Dods, Box Hill North, AU;

Adam Kowalczyk, Glen Waverly, AU;

Justin Bedo, Australian Capital Territory, AU;

Kenneth Paul Clarke, Glen Iris, AU;

Assignee:

Nicta IPR Pty Limited, Eveleigh, New South Wales, AU;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04B 10/08 (2006.01); H04B 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Monitoring an optical signal comprises sampling the optical signal from two or more distinct tap points to retrieve a sample set. Multiple such sample sets are obtained over time. A joint probability distribution or phase portrait of the sample sets is assessed for indications of optical signal quality. The tap distinction can be polarization, for example to determine OSNR, or frequency. The tap distinction can be a time delay, which can enable diagnostic differentiation between multiple impairments, such as OSNR, dispersion, PMD, jitter, Q, and the like. Machine learning algorithms are particularly suitable for such diagnosis, particularly when provided a two dimensional histogram of sample density in the phase portrait.


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