The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 01, 2011

Filed:

Jan. 09, 2009
Applicants:

Yusuke Nasu, Atsugi, JP;

Kuninori Hattori, Atsugi, JP;

Toshikazu Hashimoto, Atsugi, JP;

Yohei Sakamaki, Atsugi, JP;

Hiroshi Takahashi, Atsugi, JP;

Yasuyuki Inoue, Atsugi, JP;

Inventors:

Yusuke Nasu, Atsugi, JP;

Kuninori Hattori, Atsugi, JP;

Toshikazu Hashimoto, Atsugi, JP;

Yohei Sakamaki, Atsugi, JP;

Hiroshi Takahashi, Atsugi, JP;

Yasuyuki Inoue, Atsugi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 6/12 (2006.01);
U.S. Cl.
CPC ...
Abstract

A demodulator is provided for a multilevel differential phase shift keyed signal, capable of eliminating polarization dependence due to birefringence and polarization coupling-induced light resulting from a waveguide structure, and also, polarization dependence due to dynamic birefringence produced at the time of driving a variable phase adjuster. The demodulator is configured of an optical delay line interferometer of a waveguide interference type. The S/N ratio of a demodulated signal in the demodulator formed by the optical delay line interferometer can be also improved. Further, both the polarization dependence and the temperature dependence of the optical delay line interferometer can be reduced. The disposition of a polarization converter and groves filled with a temperature compensation material makes it possible to provide a circuit configuration suitable for eliminating the polarization dependence and the temperature dependence of the optical delay line interferometer.


Find Patent Forward Citations

Nasu, Yusuke. (2011). Optical delay line interferometer (U.S. Patent No. 7899279). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7899279

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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